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Q-NET young researchers

Astghik ADAMYAN
QDP Laboratory, Chalmers University of Technology, Gothenburg, Sweden
Female, Armenian


astghik

Diplomas:
Master’s Degree in Engineering in the field of Technology and Design of Integrated Circuits, State Engineering University of Armenia (2005-2007).
Master thesis in “Research and Development of Special I/O Quality Assurance Methods”.
Summary: There was a standard process flow to check the USBIO libraries before releasing the product. This process needed to be complete not to miss any errors and mistakes of the design. Thereby the purpose of the master thesis was to research and develop new methods for Quality Assurance flow for I/O libraries of chip. This new method could extract the areas of library cells from different steps in the process flow and compare them in order to find human or tool-related mistakes. It was later integrated into the Synopsys_Armenia company working flow.

jkhk Erasmus Mundus Master of Science in Nanoscience and Nanotechnology, Katholieke University of Leuven (KUL), (2009-2010).

jkhk Erasmus Mundus Master of Science in Nanoscale Science and Technology, Chalmers University of Technology (2010-2011).
Master thesis in “Calibration and Optimization of Near Field Scanning Microwave Microscope” (2011 Jan-June)
Summary: The focus in this master thesis project was to calibrate the NSMM and find its sensitivity to dissipation. For this purpose NSMM performance was modeled and flat gold samples embedded with superconductive niobium films were fabricated, first with e-beam lithography and then with photolithography. AFM characterization of samples with flat Au showed that fabrication method of flat gold allows to get RMS roughness of less than 1nm, essential factor to eliminate topography effect from microwave contrast. NSMM scanning of the sample fabricated with e-beam lithography showed microwave contrast after cooling down due to proximity effect.

Research experience:
hjg Quality Assurance and Characterization Engineer, R&D II in the field of electronic design automation (EDA) in semiconductor design and manufacturing, Synopsys_Armenia CJSC  (2005-2009).

hjg Practical Design of “UV Imagers for Space Applications”, Laboratory of UV imagers, IMEC, KUL (2010 April).

hjg Project in “Near Field Scanning Microwave Microscope”, Quantum Device Physics laboratory, Chalmers University of Technology (2010 Dec.).

Thesis Project : Title, Summary:
"Development of low temperature AFM-based Cavity for scanning gate spectroscopy’ - ESR11"

Near-field Scanning Microwave Microscopy (NSMM) is an emerging technique of probing conducting, magnetic and dielectric material properties with very high spatial resolution (nm scale). NSMM is sensitive to scanning tip – sample impedance, as well as local electronic properties of the sample.
The project aims at the development of a novel concept based on the placement of a superconducting coplanar waveguide resonator (CPW) in close vicinity to a tuning-fork Atomic Force Microscope (AFM) sensor and bonding an annealed niobium wire at the voltage anti-node of the resonator. This will allow to combine the spatial resolution of the AFM with the sensitivity of a high Q resonator to local electronic properties of a sample (Fig.1). It is essential to study NSMM resolution, bandwidth and sensitivity to different material properties. This setup will also allow for a simple implementation of a single electron transistor (SET) microscope with the SET fabricated on the apex of the scanning tip (Fig. 2). The project work further aims at an enhanced SET read-out bandwidth extending the reflection measurements to the microwave domain and optimizing them for 4-8 GHz.


fig1
Fig.1. AFM-assisted NSMM based on quartz tuning-fork and coplanar waveguide resonator coupled to the feedline [1].


fig2
Fig.2. SET on an AFM probe. The letters “S”, “G”, “D”, and “I” denote the source, the gate, the drain, and the island, respectively [2].

List of Publications:
"Calibration and Optimization of Near-Field Scanning Microwave Microscope", Master Thesis, Chalmers University of Technology, 2011
[deGraaf] “Magnetic field resilient superconducting fractal resonators for coupling to free spins“, S. E. de Graaf, A. V. Danilov, A. Adamyan, T. Bauch, and S. E. Kubatkin, J. of Appl. Phys. 112, 123905 (2013), Task 1.2.

A near-field scanning microwave microscope based on a superconducting resonator for low power measurements, S. E. de Graaf, A. V. Danilov, A. Adamyan, S. E. Kubatkin, Review of Scientific Instruments 84, 23706 (2013).

Galvanically split superconducting microwave resonators for introducing internal voltage bias, S. E. Graaf, D. Davidovikj, A. Adamyan, S. E. Kubatkin, A. V. Danilov, Applied Physics Letters 104, 52601 (2014).

Coupling of a locally implanted rare-earth ion ensemble to a superconducting micro-resonator, I. Wisby, S. E. de Graaf, R. Gwilliam, A. Adamyan, S. Kubatkin, P. J. Meeson, A. Ya. Tzalenchuk, T. Lindström, Applied Physics Letters 105, 102601 (2014).

Magnetic field resilient superconducting fractal resonators for coupling to free spins, S. E. de Graaf, A. V. Danilov, A. Adamyan, T. Bauch, and S. E. Kubatkin, Journal of Applied Physics 102, 123905 (2012).

Charge Qubit Coupled to an Intense Microwave Electromagnetic Field in a Superconducting Nb Device: Evidence for Photon-Assisted Quasiparticle Tunneling, S. E. de Graaf, J. Leppakangas, A. Adamyan, A. V. Danilov, T. Lindstrom, M. Fogelstrom, T. Bauch, G. Johansson, S. E. Kubatkin, Physical Review Letters 111, 137002 (2013).

Effects of quasiparticle tunnelling in a circuit-QED realization of a strongly driven two-level system, J. Leppakangas, S. E. de Graaf, A. Adamyan, M. Fogelstrom, A. V. Danilov, T. Lindstrom, S. E. Kubatkin, G. Johansson, Journal of Physics B - Atomic, Molecular and Optical Physics 46, 224019 (2013).

Kinetic inductance as a microwave circuit design variable by multilayer fabrication, A. A. Adamyan, S. E. de Graaf, S. E. Kubatkin, A. V. Danilov, Superconductor Science and Technology 28, 085007 (2015).

References
Fig.1: S. de Graaf, S. Kubatkin, NSMM for nanoscale characterization, Poster, Chalmers University of Technology (2010).
Fig.2: Henrik T. A. Brenning, Sergey Kubatkin, Per Delsing, A Single Electron Transistor on an Atomic Force Microscope Probe, NanoLetters, 2006.

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